Pattern alteration is making a pattern perfect to your requirements. This includes altering the pattern in length and width wise and/or making changes in dart positions. Length and width alteration can be done by “fold a pleat method” for decreasing and “cut and spread method” for increasing. But dart alterations are very important in pattern designing. It includes shifting to a new position and combining or splitting the darts. Dart alteration can be done by two methods:
Slash and spread method
Pivot method.
Slash and spread method: in this method pattern is slashed at new dart line and spread to the desired amount to form a new dart of desired width. This method is easy to understand as pattern shape is visible during slashing and spreading process. Following are the steps for altering a pattern by this method.
Pattern is traced with all markings.
Dart legs are marked as A and B (as shown in figure 2.a)
Slash line is drawn at new position
Pattern is slashed from slash line to bust point (figure 2.b)
Slash line is spread until dart legs A and B are closed (figure 2.c)
A and B are taped
New pattern shape is traced on a new paper
Mark ½ inch below bust point, this is dart point
Draw dart legs to dart point.
Pivot method: this method does not require slashing of the working pattern. It is faster method but requires experience. In this method pattern is pivoted, shifted and traced to make a new dart. This method include following steps:
Place the working pattern on a paper with push pin through bust point. Bust point is considered as pivotal point. (figure 3)
Name the dart legs A and B
Mark new dart position on paper beneath. Name that C
Trace the pattern from existing dart to new dart position (A to C)
Pivot the pattern until dart leg B touches A on paper
This pivoting created space for new dart. Trace the remaining section of the pattern from B to C
Never trace the section of pattern again if traced once
Remove working pattern from paper
Draw dart leg to dart point by marking ½ inch below bust point.
Cut in muslin for test fit.
Last modified: Wednesday, 23 November 2011, 12:38 PM